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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12396640 B1

PDFFull Text
Date of Patent:
Aug. 26, 2025

Filed:

Dec. 18, 2023

Frequency-domain interferometric based imaging systems and methods

Applicant:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Inventors:

Tilman Schmoll, Dublin, CA (US);

Alexandre R. Tumlinson, San Leandro, CA (US);

Matthew J. Everett, Livermore, CA (US);

Nathan D. Shemonski, San Francisco, CA (US);

Assignee:

CARL ZEISS MEDITEC, INC., Dublin, CA (US);

Attorney:

SNELL & WILMER L.L.P.

Primary Examiner:

Wyatt A Stoffa

Assistant Examiner:

Grant A Gagnon

Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01); A61B 3/15 (2006.01); G01B 9/02 (2022.01); G01B 9/02004 (2022.01); G01B 9/02015 (2022.01); G01B 9/02055 (2022.01); G01B 9/02091 (2022.01); G01B 9/02097 (2022.01); G01N 21/47 (2006.01); G02B 21/00 (2006.01); G02B 27/09 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); A61B 3/0041 (2013.01); A61B 3/0075 (2013.01); A61B 3/1025 (2013.01); A61B 3/1225 (2013.01); A61B 3/152 (2013.01); G01B 9/02004 (2013.01); G01B 9/0203 (2013.01); G01B 9/02032 (2013.01); G01B 9/02043 (2013.01); G01B 9/02044 (2013.01); G01B 9/02072 (2013.04); G01B 9/02077 (2013.01); G01B 9/02085 (2013.01); G01B 9/02091 (2013.01); G01B 9/02097 (2013.01); G01N 21/4795 (2013.01); G02B 21/0056 (2013.01); G02B 27/0927 (2013.01); G01N 2021/458 (2013.01);
Abstract

Systems and methods for improved interferometric imaging are presented. One embodiment is a partial field frequency-domain interferometric imaging system in which a light beam is scanned in two directions across a sample and the light scattered from the object is collected using a spatially resolved detector. The light beam could illuminate a spot, a line or a two-dimensional area on the sample. Additional embodiments with applicability to partial field as well as other types of interferometric systems are also presented.

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