The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Aug. 14, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Huilin Xu, Temecula, CA (US);

Chenxi Hao, Beijing, CN;

Ruifeng Ma, Beijing, CN;

Yuwei Ren, Beijing, CN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/0446 (2023.01); H04W 72/1263 (2023.01); H04W 72/232 (2023.01); H04W 72/541 (2023.01);
U.S. Cl.
CPC ...
H04W 72/0446 (2013.01); H04W 72/1263 (2013.01); H04W 72/232 (2023.01); H04W 72/541 (2023.01);
Abstract

Methods, systems, and devices for wireless communications are described. In some systems, a base station may transmit a slot format indicator (SFI) to a first user equipment (UE) via downlink control information (DCI) and the first UE may use the SFI to determine time-domain resources over which the first UE may measure cross link interference (CLI) arising from a transmission from a second UE. The first UE may use the SFI as an index into a slot format combination table, which may also be used for uplink and downlink scheduling or may be exclusively used for determining the time-domain resources for CLI measurement. The first UE may determine a set of slot formats from a slot format table based on a slot format combination corresponding to the SFI index and may determine over which symbols the first UE may measure CLI based on the set of slot formats.


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