The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Mar. 30, 2023
Applicant:

Araceli Biosciences Inc., Tigard, OR (US);

Inventor:

Shiou-Jyh Ja, Portland, OR (US);

Assignee:

ARACELI BIOSCIENCES, Tigard, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 25/673 (2023.01); G02B 21/36 (2006.01); H04N 23/76 (2023.01);
U.S. Cl.
CPC ...
H04N 25/673 (2023.01); G02B 21/367 (2013.01); H04N 23/76 (2023.01);
Abstract

Methods and systems are provided for correcting intensity variation in a raw image acquired via a microscopy imaging system. In one example, a method includes acquiring a reference image and developing an intensity model based on the reference image wherein the intensity model comprises a pre-determined number of a plurality of model parameters obtained via curve fitting a single analytical function or a linear combination of a plurality of analytical functions, embedding model parameters of the intensity model of the reference image into the raw image for image processing at a later time; and correcting the raw image based on the intensity model of the reference image on-demand. As another example, a method includes utilizing the plurality of parameters of the intensity model as a hardware signature to indicate whether a plurality of optical system parameters is maintained.


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