The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Oct. 17, 2023
Applicant:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Inventors:
Assignee:
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 7/00 (2017.01); G06V 20/40 (2022.01); G06V 40/16 (2022.01); H04N 23/60 (2023.01); G06V 20/52 (2022.01);
U.S. Cl.
CPC ...
H04N 23/64 (2023.01); G06T 7/0002 (2013.01); G06V 20/41 (2022.01); G06V 40/165 (2022.01); G06V 40/172 (2022.01); H04N 7/183 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30168 (2013.01); G06T 2207/30201 (2013.01); G06T 2207/30232 (2013.01); G06V 20/52 (2022.01);
Abstract
A method and apparatus for detecting the best shot in a long-range face recognition system is provided. The method of detecting the best shot includes detecting a facial area in an image received from the outside, calculating a quality element measurement value of the face image by analyzing the facial area, and selecting a best shot face image, among the detected facial areas, based on the quality element measurement value.