The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Nov. 30, 2023
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Myriam Titon, Jerusalem, IL;

Jeremy Samama, Herzliya, IL;

Rachel Lemberg, Herzliya, IL;

Yaniv Lavi, Tel Aviv-Jaffa, IL;

Hagit Grushka, Lehavim, IL;

Michael Tony Alburquerque, Tel-Aviv, IL;

Eliya Habba, Petah Tikva, IL;

Dor Grynshpan, Ramat Gan, IL;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/0631 (2022.01); G06F 40/20 (2020.01); H04L 41/16 (2022.01);
U.S. Cl.
CPC ...
H04L 41/064 (2013.01); G06F 40/20 (2020.01); H04L 41/16 (2013.01);
Abstract

Disclosed herein is a system for determining scores that are usable to filter a larger set of metrics (e.g., thousands of metrics) down to a smaller set of relevant metrics (e.g., hundreds of metrics) that can be more efficiently queried and ingested for root-cause analysis of an incident. During a training stage, the system analyzes known incidents and converts the names of the metrics, as described via customer-defined words, into mathematical representations (e.g., word embedding featurization vectors). When a new metric with a new name is received for a new incident, the system implements an incident inference stage during which the new name is converted into a new mathematical representation. The system compares the new mathematical representation to the mathematical representations to identify a similar mathematical representation. The system retrieves the score for the metric associated with the similar mathematical representation and assigns the retrieved score to the new metric.


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