The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

May. 18, 2022
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Peter D. Brewer, Westlake Village, CA (US);

Chia-Ming Chang, Agoura Hills, CA (US);

Partia Naghibi Mahmoudabadi, Canoga Park, CA (US);

Sevag Terterian, Lake Balboa, CA (US);

Diego Eduardo Carrasco, Los Angeles, CA (US);

Charbel Abijaoude, Newbury Park, CA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
H01L 24/75 (2013.01); G06T 7/60 (2013.01); H01L 24/81 (2013.01); H01L 2224/75001 (2013.01); H01L 2224/81201 (2013.01);
Abstract

A method to aid in a calibration of a compression system includes mounting a first substrate in a press. The press has calibration parameters, and the first substrate has a test film on a first surface. The method includes mounting a second substrate in the press. The second substrate has spikes arranged in a spike pattern on a second surface. The method includes compressing the first substrate and the second substrate together with a force that causes the spikes to form indentations in the test film, separating the first substrate from the second substrate, determining local pressures applied by the spikes against the test film, and adjusting one or more calibration parameters of the press in response to the local pressures.


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