The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Mar. 16, 2023
Sumitomo Rubber Industries, Ltd., Kobe, JP;
Kazuma Tokuda, Kobe, JP;
SUMITOMO RUBBER INDUSTRIES, LTD., Kobe, JP;
Abstract
An abnormality detecting apparatus includes a signal obtaining unit, a first index calculation unit, a spectrum calculation unit, a standardization unit, and a second index calculation unit. The signal obtaining unit obtain signals indicating a rotation speed of the wheel assembly, as pulses having a rise. The first index calculation unit calculates a first index indicating a temporal variation of the rise of each of the pulses. The spectrum calculation unit calculates a frequency spectrum of rotational orders from a first order to an mth order of the first index calculated for each of the pulses. The standardization unit standardizes a gain for each rotational order of the frequency spectrum using a mean value and a standard deviation of the gain for each rotational order when there is no abnormality. The second index calculation unit calculates a second index for determining whether there is an abnormality.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile