The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Jul. 21, 2022
Applicant:

Kyocera Document Solutions Inc., Osaka, JP;

Inventors:

Takuya Miyamoto, Osaka, JP;

Kanako Morimoto, Osaka, JP;

Rui Hamabe, Osaka, JP;

Shiro Kaneko, Osaka, JP;

Naomichi Higashiyama, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/77 (2022.01); G06V 10/26 (2022.01);
U.S. Cl.
CPC ...
G06V 10/7715 (2022.01); G06V 10/26 (2022.01);
Abstract

A feature-amount extraction unit generates a base feature-map group constituted by a plurality of base feature maps from an input image, applies a plurality of statistic calculations to the base feature maps in the base feature-map group, and generates a plurality of types of statistic maps. The inference unit derives inference results of segmentation for inference inputs based on the plurality of statistic maps. Each of the plurality of types of statistic calculations described above is processing of calculating a statistic with a specific window size and a specific calculation formula, and the plurality of types of statistic calculations are different from each other in at least either one of the window size and the calculation formula.


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