The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

May. 10, 2022
Applicant:

Globus Medical, Inc., Audubon, PA (US);

Inventor:

Sanjay M. Joshi, Andover, MA (US);

Assignee:

Globus Medical, Inc., Audubon, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); A61B 34/20 (2016.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); A61B 34/20 (2016.02); A61B 2034/2055 (2016.02); A61B 2034/2061 (2016.02); A61B 2034/2065 (2016.02); A61B 2034/2072 (2016.02); A61B 2090/3764 (2016.02);
Abstract

A system configured to perform an accuracy check of a tracked instrument can include a processing circuitry and memory coupled to the processing circuitry. The memory can include instructions to cause the system to perform operations. The operations can include determining a virtual position of a display device. The operations can further include determining a virtual position of the tracked instrument. The operations can further include determining a point of contact on the display device between the tracked instrument and the display device. The operations can further include determining an expected point of contact on the display device between the tracked instrument and the display device based on the virtual position of the display device and the virtual position of the tracked instrument. The operations can further include determining whether the tracked instrument is accurate based on a difference between the point of contact and the expected point of contact.


Find Patent Forward Citations

Loading…