The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Apr. 08, 2023
Applicant:

Wipotec Gmbh, Kaiserslautern, DE;

Inventors:

Michael Siegrist, Kaiserslautern, DE;

Manuel Bastuck, Kaiserslautern, DE;

Assignee:

Wipotec GmbH, Kaiserslautern, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/11 (2017.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20161 (2013.01); G06T 2207/30128 (2013.01);
Abstract

A method for detecting anomalies in digital images of products, wherein a region of a digital image is detected as a maximum anomaly if the value of a property of the region is greater than a predetermined maximum threshold, and/or wherein a region is detected as a minimum anomaly if the value of the property of the region is less than a predetermined minimum threshold. The maximum threshold value and/or the minimum threshold value are determined in a learning process using relatively few digital images based on a statistical distribution of the largest or smallest values of a specific quantity used for the detection of anomalies in digital images to be examined.


Find Patent Forward Citations

Loading…