The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Mar. 11, 2020
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Akihiro Yamaguchi, Kita, JP;

Shigeru Maya, Yokohama, JP;

Kohei Maruchi, Setagaya, JP;

Tatsuya Inagi, Kawasaki, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/10 (2019.01);
U.S. Cl.
CPC ...
G06N 20/10 (2019.01);
Abstract

A time series data analysis method, includes: generating a plurality of first feature vectors including feature amounts of a plurality of feature waveforms, based on distances from a plurality of first time series data sequences to the plurality of feature waveforms, the first time series data sequences belonging to a first class; generating a plurality of second feature vectors including feature amounts of the plurality of feature waveforms, based on distances from a plurality of second time series data sequences to the plurality of feature waveforms, the plurality of second time series data sequences belonging to a second class; and updating the plurality of feature waveforms, based on the plurality of first feature vectors, the plurality of second feature vectors, a performance indicator parameter related to a performance indicator for a classification model and a model parameter including weights on the plurality of feature waveforms.


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