The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Jun. 13, 2022
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Maharaj Mukherjee, Poughkeepsie, NY (US);

Prashant Thakur, Gujarat, IN;

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 10/60 (2022.01); G06F 40/20 (2020.01); G06N 10/80 (2022.01); G06Q 30/0601 (2023.01); H04L 51/02 (2022.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 10/60 (2022.01); G06F 40/20 (2020.01); G06N 10/80 (2022.01); G06Q 30/0631 (2013.01); H04L 51/02 (2013.01); G06N 20/00 (2019.01);
Abstract

Methods for detecting non-linear data dependencies in machine learning using hybrid quantum computing. Methods include receiving a selection of an accuracy metric. Methods include receiving a data set comprising a plurality of data elements for processing by a machine learning model operating on a machine learning system. Methods include identifying a plurality of data elements within each data set. Methods include identifying one or more features for each data element. Methods include determining a total number of features for the data set. Methods include reducing, by a quantum annealing method, based on the accuracy metric, the total number of features to a reduced number of features. Methods include inputting the reduced number of features into the machine learning model. Methods include outputting a result from the machine learning model.


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