The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Apr. 18, 2023
Qualcomm Incorporated, San Diego, CA (US);
Kunal Desai, Bangalore, IN;
Deepak Kumar Agarwal, Bangalore, IN;
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A die-to-die serial data link may be dynamically configured to exclude lanes associated with data errors. In a test mode, data may be transmitted from a first die to a second die over lanes of the link. In the second die, data received on the link in the test mode may be compared with an expected data pattern to detect any bit mismatches. When there are no more than a threshold number of mismatched bits, a receive path in the second die may be configured to use all of the lanes. When there are more than the threshold number of mismatched bits, a sub-group of the lanes that are not associated with mismatched bits may be determined, and the receive path in the second die may be configured to use the sub-group of lanes. In the first die, a transmit path may be configured to use the sub-group of lanes.