The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Aug. 10, 2023
Applicant:

Kyndryl, Inc., New York, NY (US);

Inventors:

Naga A. Ayachitula, Dobbs Ferry, NY (US);

Rohit Khandekar, Jersey City, NJ (US);

Upendra Sharma, Hartsdale, NY (US);

Assignee:

Kyndryl, Inc., New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06N 5/022 (2023.01);
U.S. Cl.
CPC ...
G06F 11/004 (2013.01); G06N 5/022 (2013.01); G06F 2201/81 (2013.01);
Abstract

Embodiments relate to early detection of information technology (IT) failures in a computing system. A technique is executed by one or more processors and includes receiving multiple IT records including past and recent historical data, extracting first and second time series sections from the past and recent historical data, respectively, training a failure detection model to correlate metric patterns in the first time series sections with at least one of other metric patterns and previous IT failures and, in response to the training, using the failure detection model to predict at least one of upcoming metric patterns and upcoming IT failures from metric patterns in the second time series sections.


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