The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Jun. 03, 2024
Applicant:

Phaidra, Inc., Seattle, WA (US);

Inventors:

Christopher R. Vause, Austin, TX (US);

Cagdas Alcicek, Seattle, WA (US);

Priyam Agarwal, Seattle, WA (US);

Katherine Elizabeth Hoffman, Silverdale, WA (US);

Vedavyas Panneershelvam, Burnaby, CA;

Assignee:

Phaidra, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41885 (2013.01); G05B 19/4183 (2013.01); G05B 19/41845 (2013.01);
Abstract

In variants, a method for industrial process control can include: determining an industrial system representation using a set of industrial system templates, wherein each template is associated with a control model and a set of attributes corresponding to control model features; determining associations between the attributes of the industrial system representation and data streams from the industrial system; and generating a set of control instructions for the industrial system based on the data streams associated with the attributes.


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