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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12393117 B1

PDFFull Text
Date of Patent:
Aug. 19, 2025

Filed:

Jan. 29, 2021

Marker, method for manufacturing marker, and detection target

Applicant:

Dai Nippon Printing Co., Ltd., Tokyo, JP;

Inventors:

Tadashi Furukawa, Tokyo, JP;

Koujiro Ookawa, Tokyo, JP;

Yukio Taniguchi, Tokyo, JP;

Hideaki Fujisaki, Tokyo, JP;

Keiji Kashima, Tokyo, JP;

Assignee:

DAI NIPPON PRINTING CO., LTD., Tokyo, JP;

Attorney:

Oliff PLC

Primary Examiner:

Sunghee Y Gray

Int. Cl.
CPC ...
G03F 7/105 (2006.01); B32B 7/12 (2006.01); B32B 17/06 (2006.01); B32B 17/10 (2006.01); B32B 25/08 (2006.01); B32B 25/20 (2006.01); B32B 27/30 (2006.01); B32B 27/32 (2006.01); B32B 27/36 (2006.01); B32B 27/38 (2006.01); G01B 11/00 (2006.01); G02B 5/02 (2006.01); G06K 19/06 (2006.01);
U.S. Cl.
CPC ...
G03F 7/105 (2013.01); G01B 11/002 (2013.01); G02B 5/0284 (2013.01); B32B 7/12 (2013.01); B32B 17/063 (2013.01); B32B 17/10 (2013.01); B32B 25/08 (2013.01); B32B 25/20 (2013.01); B32B 27/304 (2013.01); B32B 27/32 (2013.01); B32B 27/325 (2013.01); B32B 27/36 (2013.01); B32B 27/365 (2013.01); B32B 27/38 (2013.01); B32B 2255/26 (2013.01); B32B 2255/28 (2013.01); B32B 2264/0214 (2013.01); B32B 2270/00 (2013.01); B32B 2307/412 (2013.01); B32B 2307/416 (2013.01); B32B 2519/00 (2013.01); G06K 19/06037 (2013.01);
Abstract

A high-precision marker, which is easy to manufacture, has a base material layer, a first layer which is laminated onto one surface of the base material layer, and which is observed in a first color, and a second layer which is partially laminated onto the first layer, is observed in a second color different from the first color, and partially conceals the first layer, wherein the first layer is observable in a region in which the second layer is not laminated, and the second layer is formed by a resist material.

Find Patent Forward Citations

Furukawa, Tadashi. (2025). Marker, method for manufacturing marker, and detection target (U.S. Patent No. 12393117). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12393117

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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