The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Feb. 14, 2024
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Andreas Lotter, Wetzlar, DE;

Christian Schulz, Wetzlar, DE;

Christian Schumann, Wetzlar, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 15/14 (2006.01); G02B 15/20 (2006.01); G02B 21/02 (2006.01); G02B 21/36 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0025 (2013.01); G02B 15/143 (2019.08); G02B 15/20 (2013.01); G02B 21/025 (2013.01); G02B 21/36 (2013.01);
Abstract

An optical system for a microscope for imaging an object includes: a telescope system having an optical correction unit, which is adjustable in order to correct a spherical imaging aberration, and having a zoom optical unit, which is adjustable in order to adapt a magnification of the telescope system to a ratio of two refractive indices, one of which is assigned to an object side and an other of which is assigned to an image side, within a predetermined magnification range. The telescope system is telecentric over an entire magnification range both with respect to the object side and with respect to the image side by the zoom optical unit contained in the telescope system.


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