The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Mar. 30, 2022
Applicant:

Teledyne Flir Commercial Systems, Inc., Goleta, CA (US);

Inventors:

Gregory Fitzgerald, Marlborough, MA (US);

Alan D. Kathman, Charlotte, NC (US);

David Ovrutsky, Charlotte, NC (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); H04N 23/23 (2023.01); H04N 23/51 (2023.01); H04N 23/52 (2023.01); H04N 23/54 (2023.01); H04N 23/55 (2023.01);
U.S. Cl.
CPC ...
G02B 27/0018 (2013.01); H04N 23/23 (2023.01); H04N 23/51 (2023.01); H04N 23/52 (2023.01); H04N 23/54 (2023.01); H04N 23/55 (2023.01);
Abstract

Various techniques are disclosed to provide for reducing undesired reflections in captured images. In one example, a system includes an optical element configured to pass radiation from a scene. The system also includes an imager configured to capture images in response to the scene radiation and reflect at least a portion of the scene radiation to the optical element. The optical element comprises a surface with a convex radius of curvature facing the imager and configured to receive and return the reflected radiation toward the imager in a distribution pattern to reduce a magnitude of the reflected radiation in the captured images. Additional methods, devices, and systems are also provided.


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