The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Nov. 21, 2023
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Kai Ritschel, Wetzlar, DE;

Mate Beljan, Wetzlar, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/26 (2013.01);
Abstract

Embodiments of the present invention relate to an optical imaging system, and to methods, systems, and computer programs for such an optical imaging system. The methods comprise obtaining first image data of an imaging device of the imaging system, the first image data comprising a representation of a pattern. The methods comprise obtaining second image data of the pattern from the imaging device after the pattern has been displaced by a stage of the optical imaging system by a distance in a dimension defined relative to the stage. The methods comprise determining an offset between the patterns of the first and second image data in two dimensions. The methods comprise calculating a conversion parameter based on the offset and the distance. A first method comprises controlling a drive unit configured to displace the stage based on the conversion parameter.


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