The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Feb. 28, 2023
Aptiv Technologies Ag, Schaffhausen, CH;
Xin Zhang, Agoura Hills, CA (US);
Zhengzheng Li, Agoura Hills, CA (US);
Yu Zhang, Thousand Oaks, CA (US);
Aptiv Technologies AG, Schaffhausen, CH;
Abstract
This document describes a radar system to universally detect direct-of-arrival (DoA) and direction-of-departure (DoD) angles in direct-path and multipath reflection conditions. For example, a radar system includes a transmitter and receiver array with a first array forming a minimum redundancy array and a second array forming a sparse uniform linear array. A processor determines, using second-array measurements, estimated angles. The quantity of estimated angles is larger than the quantity of actual angles due to angular ambiguity of the second array. The processor then identifies multiple potential sets of actual angles from among the estimated angles and tests each set under a maximum likelihood criterion using first-array measurements. The DoA and DoD angles are identified as the respective set with a maximum utility function value. In this way, the processor determines actual angles with improved resolution and reduced cost without having to identify whether a direct-path or multipath reflection condition exists.