The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Jun. 15, 2023
Applicant:

SK on Co., Ltd., Seoul, KR;

Inventors:

Chang Mook Hwang, Daejeon, KR;

Na Eun Gil, Daejeon, KR;

Hyun Ji Kim, Daejeon, KR;

Jong Hyeok Lee, Daejeon, KR;

Yoon Ji Jo, Daejeon, KR;

Assignee:

SK ON CO., LTD., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/374 (2019.01); G01R 31/36 (2020.01); G01R 31/3835 (2019.01); G01R 31/392 (2019.01); H02J 7/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/374 (2019.01); G01R 31/3644 (2013.01); G01R 31/3835 (2019.01); G01R 31/392 (2019.01); H02J 7/0048 (2020.01); H02J 7/00712 (2020.01);
Abstract

The present invention provides an apparatus and a method for evaluating performance of a battery and equipment for transporting the battery. The battery performance evaluation apparatus of the present invention includes: a temperature measurement unit for measuring an aging temperature of the battery; a voltage measurement unit for measuring a first open circuit voltage of the battery at the start of aging and measuring a second open circuit voltage of the battery at the end of aging; and a processor for calculating a delta voltage of a voltage drop using a difference between the first open circuit voltage and the second open circuit voltage measured by the voltage measurement unit, and determining normal or defective of the battery based on the delta voltage calculated using the aging temperature measured by the temperature measurement unit and an aging period between measurement times of the first and second open circuit voltage.


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