The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Feb. 06, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Tsukasa Suenari, Tokyo, JP;

Taichiro Yamashita, Tokyo, JP;

Takenori Okusa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E05B 65/52 (2006.01); B01L 3/00 (2006.01); G01N 35/00 (2006.01); G01N 37/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00 (2013.01); B01L 3/5055 (2013.01); B01L 2200/141 (2013.01); B01L 2300/043 (2013.01); B01L 2300/0609 (2013.01); B01L 2300/0663 (2013.01);
Abstract

An automatic analyzer capable of improving maintainability by facilitating access to an interlock unit. The interlock unit includes an operation member configured to be movably supported between a lock position and a lock release position, and obstruct rotation to an open position of a cover; an electromagnetic driving unit configured to drive the operation member, and a driving connecting unit configured to connect the operation member and the electromagnetic driving unit and drive the operation member by conveying an operation of the electromagnetic driving unit to the operation member. The interlock unit is provided to be attachable and detachable to and from the housing.


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