The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Dec. 18, 2023
Applicant:

Trustees of Boston University, Boston, MA (US);

Inventors:

M. Selim Ünlü, Newton, MA (US);

Iris Celebi, Allston, MA (US);

Mete Aslan, Brighton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01B 9/02 (2022.01); G01B 9/02001 (2022.01); G01N 21/21 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01B 9/02011 (2013.01); G01B 9/02041 (2013.01); G01N 21/21 (2013.01); G01N 21/55 (2013.01); G01N 2201/06153 (2013.01);
Abstract

Aspects of inventive concepts described herein relate to an interferometric reflectance imaging system. The system can include an imaging sensor including pixels that are preferentially sensitive to a plurality of light components; an illumination source configured to emit illumination light along an illumination path, the illumination light including the plurality of light components; and a target including a target substrate configured to support one or more nanoparticles on a surface of the target substrate. The system may be configured to, at a nominal focus position: generate an image at the imaging sensor based, at least in part, on the light reflected from the target interfering with light scattered from nanoparticles on the target substrate; and process the image to detect the nanoparticles on the target substrate.


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