The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Mar. 13, 2023
Hamamatsu Photonics K.k., Hamamatsu, JP;
Hisanari Takahashi, Hamamatsu, JP;
Koyo Watanabe, Hamamatsu, JP;
Hiroshi Satozono, Hamamatsu, JP;
Kyohei Shigematsu, Hamamatsu, JP;
Takashi Inoue, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
Abstract
A time response measurement apparatus includes a pulse formation unit, an attenuation unit, a waveform measurement unit, and an analysis unit. The pulse formation unit generates first pulsed light including a wavelength of pump light, second pulsed light including a wavelength of probe light, and third pulsed light including the wavelength of the pump light and the wavelength of the probe light, on a common optical axis. The attenuation unit transmits the first pulsed light, the second pulsed light, and the third pulsed light output from a sample arranged on the optical axis after being incident on the sample. An attenuation rate for the pump light is larger than an attenuation rate for the probe light. The analysis unit obtains a time response of the sample based on temporal waveforms of the first pulsed light, the second pulsed light, and the third pulsed light having passed through the attenuation unit.