The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Jul. 05, 2022
Applicant:

National Center for Nanoscience and Technology, Beijing, CN;

Inventors:

Qing Dai, Beijing, CN;

Chenchen Wu, Beijing, CN;

Xiaoxia Yang, Beijing, CN;

Xiangdong Guo, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3577 (2014.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3577 (2013.01); G01N 21/85 (2013.01);
Abstract

The invention provides a plasmon enhanced infrared spectrum sensor for detecting a protein secondary structure in an aqueous solution and a preparation method of the plasmon enhanced infrared spectrum sensor, and belongs to the technical field of infrared optical sensing. The sensor includes a graphene plasmon chip and a micro-fluidic system compatible with infrared transmission testing. Under excitation of incident infrared light, a locally enhanced electromagnetic field (surface plasmon) is formed on the surface of the graphene layer due to collective oscillation of charges, and molecules to be detected in an aqueous solution are enriched in a surface plasmon region due to Van der Waals interaction of the graphene layer. The infrared response of to-be-detected molecules gathered in the plasmon region is enhanced under the driving of an electromagnetic field of graphene plasmon; meanwhile, water molecules are excluded out of a plasmon region, molecular signals out of the plasmon region can be completely eliminated by using an in-situ electrical background deduction method, and direct and in-situ monitoring of trace solution components by infrared spectroscopy is realized.


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