The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Sep. 28, 2020
Jasco Corporation, Tokyo, JP;
Masaru Shimizu, Tokyo, JP;
Jun Koshobu, Tokyo, JP;
JASCO CORPORATION, Tokyo, JP;
Abstract
A circular dichroism measurement apparatus includes a laser light source (QCL) capable of sweeping a wavenumber of a laser light in an infrared wavenumber range containing at least one peak of the sample; a sample chamber where the sample is disposed; a photoelastic modulator that modulates a polarization state of the laser light before or after the laser light of a specific wavenumber in a wavenumber sweep transmits the sample; a detector that detects a variation in intensity of the laser light which transmitted the sample and of which its polarization state is modulated; and a signal processing device that extracts an alternating-current component (AC) that synchronize with a modulation frequency and a direct-current component (DC) from a detected signal of the detector, and calculates a value of infrared circular dichroism of the sample based on a ratio (AC/DC) of the AC and DC.