The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
May. 09, 2025
Wuhan Institute of Technology, Wuhan, CN;
Wuhan Institute of Technology, Wuhan, CN;
Abstract
A defect detection method and device based on nonlinear system identification are provided. The defect detection method includes: performing, by a modal force hammer, hammer excitation on a test specimen according to a test schedule to generate an excitation signal and a response signal; acquiring, by a laser vibrometer, the excitation signal and the response signal; performing parameter calculation on the excitation signal and the response signal to obtain model parameters; constructing an initial Hammerstein model based on the model parameters; optimizing the initial Hammerstein model to obtain a Hammerstein model of the test specimen; adjusting the Hammerstein model of the test specimen by using a cross-validation method; perform defect determination based on the Hammerstein model of the test specimen adjusted and a pre-constructed template specimen model to obtain a determination result, and determining whether the test specimen is defective based on the determination result.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile