The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Feb. 07, 2022
Applicant:

Sumitomo Rubber Industries, Ltd., Kobe, JP;

Inventor:

Ryo Mashita, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01N 3/08 (2006.01); G01N 3/56 (2006.01); G01N 9/24 (2006.01); G01N 23/046 (2018.01); G01N 23/083 (2018.01); G01N 33/44 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); G01N 3/56 (2013.01); G01N 9/24 (2013.01); G01N 23/046 (2013.01); G01N 23/083 (2013.01); G01N 33/445 (2013.01); G06T 7/0004 (2013.01); G01N 2203/0017 (2013.01); G01N 2203/0252 (2013.01); G01N 2203/0266 (2013.01); G01N 2203/0647 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G01N 2223/505 (2013.01); G01N 2223/601 (2013.01);
Abstract

A performance evaluation method for elastic material including rubber or elastomer, the method includes a strain applying step of applying a strain to a test piece made of an elastic material, an imaging step of obtaining projected images of the test piece being strained by irradiating X-rays to the test piece, a detection step of detecting low-density regions in the test piece based on the projected images, wherein each low-density region is a region where density of a part of the elastic material becomes lower than that before receiving the strain, a relationship obtaining step of obtaining a density distribution between the densities and frequency of the low-density regions based on the detected low-density regions, and a distribution width calculation step of calculating a distribution width specified by a full width at half maximum FWHM from the density distribution approximated to a normal distribution.


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