The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Sep. 13, 2023
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Jongmin Lee, Albuquerque, NM (US);
Weng W. Chow, Albuquerque, NM (US);
Adrian Samuel Orozco, Albuquerque, NM (US);
Jonathan David Sterk, Albuquerque, NM (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
A large-dynamic and high-sensitive measurement protocol of an evanescent-field-mode guided atom interferometer accelerometer is disclosed. Cold atoms of a finite temperature are one-dimensionally guided in an evanescent field optical dipole trap. The first-step pathfinder protocol employs the revival of atomic coherence, i.e., the recovery of atomic fringe visibility to capture global interferometric signature to provide the information (e.g., a large-range of approximate acceleration sensing) to optimize the physical parameters for the second-step high-precision guided LPAI measurement. The contrast of atomic fringe visibility returns to unity given a specific interrogation time during the pulse sequence. To ensure the optimal interrogation time, the method employs a time-scanning sequence about the anticipated optimal interrogation time. The anticipated optimal interrogation time is determined via a conventional inertial measurement unit co-sensor or through the use of a look-up table. The method may alternatively employ a phase-scanning sequence.