The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Jul. 10, 2023
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Haruki Miyasaka, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01B 11/27 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01B 11/27 (2013.01); G01J 3/50 (2013.01);
Abstract

A measurement guide is a measurement guide for aligning an opening portion of a colorimetric device with a measurement site of a measurement target, the colorimetric device including the opening portion provided at a bottom portion of a device main body and through which light arriving from the measurement target is introduced into the device main body and an incident light processing unit for processing light entering through the opening portion, the measurement guide including a frame configured to form an outer periphery of a concave portion into which the bottom portion is fitted, and a sheet material having translucency and configured to form a bottom surface of the concave portion, wherein the sheet material has a window portion that aligns with the opening portion when the bottom portion is fitted into the concave portion.


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