The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Aug. 24, 2023
Samsara Inc., San Francisco, CA (US);
Evaline Shin-Tin Tsai, Cupertino, CA (US);
Kieran K. Gupta, San Francisco, CA (US);
Margaret Irene Finch, San Francisco, CA (US);
Matthew Lee Basham, Oakland, CA (US);
Bodecker John Dellamaria, Crystal Lake, IL (US);
Brian Tuan, Cupertino, CA (US);
James Chen, San Francisco, CA (US);
Jason Noah Laska, San Francisco, CA (US);
Jason Frederic Symons, Dublin, CA (US);
John Charles Bicket, Burlingame, CA (US);
Kavya Joshi, San Francisco, CA (US);
Ryan Reading, San Francisco, CA (US);
Sabrina Quinn Shemet, Felton, CA (US);
Sean Kyungmok Bae, San Francisco, CA (US);
Ishaan Kansal, San Francisco, CA (US);
Samsara Inc., San Francisco, CA (US);
Abstract
A baseline event detection system to detect events by performing operations that include: generating a baseline data set; accessing a data stream; performing a comparison of the baseline data set and the data stream; and detecting an event based on the comparison.