The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Sep. 18, 2023
Auris Health, Inc., Santa Clara, CA (US);
Chauncey F. Graetzel, Palo Alto, CA (US);
David Paul Noonan, San Francisco, CA (US);
Auris Health, Inc., Santa Clara, CA (US);
Abstract
A method of controlling an instrument involves measuring strain of one or more optical fibers associated with an elongate shaft of an instrument, determining a first shape estimation of the elongate shaft based on the measured strain, determining, based on the measured strain, a strain-indicated characteristic of the elongate shaft with respect to a mechanical condition of the elongate shaft, determining an expected range of the mechanical condition of the elongate shaft, determining that the strain-indicated characteristic is outside of the expected range of the mechanical condition, and in response to the determination that the strain-indicated characteristic is outside of the expected range, determining a second shape estimation of the elongate shaft, the second shape estimation being based to a lesser degree on the measured strain compared to the first shape estimation.