The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

May. 12, 2021
Applicant:

Sunrise Technologies Co., Ltd., Beijing, CN;

Inventors:

Kexin Xu, Beijing, CN;

Mingfei Yao, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/441 (2013.01); A61B 5/0075 (2013.01); A61B 5/6831 (2013.01);
Abstract

Provided are a method, an apparatus and a system of measuring tissue element, an electronic device, and a medium. The method includes: acquiring a target image information of a target position of a tissue to be measured and a pre-stored template image information of a locating position, the target image information includes a surface target image and/or an internal target image, and the template image information includes a surface template image and/or an internal template image; determining the target position as the locating position in response to the target image information being matched with the template image information; determining a measurement position according to the locating position and a corresponding relationship between the locating position and the measurement position of the tissue to be measured, the measurement position is a position meeting a reproducibility; and performing a tissue element measurement at the measurement position.


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