The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2025
Filed:
Mar. 26, 2020
Hoya Lens Thailand Ltd., Pathumthani, TH;
Eiichiro Yamaguchi, Tokyo, JP;
Toshiaki Sonehara, Tokyo, JP;
Ayumu Ito, Tokyo, JP;
Nagisa Ishihara, Tokyo, JP;
HOYA LENS THAILAND LTD., Pathumthani, TH;
Abstract
A measuring method for measuring sensitivity of eye around certain line of sight includes: showing image of predetermined pattern on a display screen showing in front of eyeball of subject by display device secured to head; showing fixation target focused on by subject, on display screen to make line of sight of subject; showing change region where predetermined pattern image is changed, at anisotropic area around intersection point or fixation target in screen is separated from intersection point and fixation target, intersection point wherein subject certain line of sight focuses on fixation target, crosses display screen; showing change region where predetermined image pattern is changed on display screen, wherein change region manner is continuously or intermittently brought close to or away from intersection point or fixation target in display screen; and determining range wherein subject senses change region by bringing it close or away from intersection point or fixation target.