The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Sep. 14, 2021
Applicant:

Metalenz, Inc., Boston, MA (US);

Inventors:

Robert C. Devlin, Stoneham, MA (US);

John Graff, Swampscott, MA (US);

Assignee:

Metalenz, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/00 (2006.01); G02B 5/18 (2006.01); G02B 27/09 (2006.01); G02B 27/42 (2006.01); H04N 23/55 (2023.01); H10F 39/00 (2025.01);
U.S. Cl.
CPC ...
H10F 39/806 (2025.01); G02B 1/002 (2013.01); G02B 5/1809 (2013.01); G02B 5/1814 (2013.01); G02B 27/0944 (2013.01); G02B 27/0988 (2013.01); G02B 27/4233 (2013.01); G02B 27/4244 (2013.01); G02B 27/4294 (2013.01); H04N 23/55 (2023.01); H10F 39/804 (2025.01); H10F 39/8053 (2025.01);
Abstract

Hybrid imaging systems incorporating conventional optical elements and metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements are provided. Systems and methods describe the integration of apertures with metasurface elements and refractive optics with metasurface elements in illumination sources and sensors.


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