The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Apr. 10, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Huilin Xu, Temecula, CA (US);

Ruifeng Ma, Beijing, CN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/336 (2015.01); H04W 56/00 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/336 (2015.01); H04W 56/001 (2013.01);
Abstract

Methods, systems, and devices for wireless communications are described. Generally, a base station may transmit, to a victim user equipment (UE) a configuration message indication one or more resource for measuring cross-link interference (CLI) from an aggressor UE. The configuration message may include one or more cell parameters, which may include an indication of a relationship between the serving cell of the victim UE and the serving cell of the aggressor UE. The victim UE may determine the relationship between the serving cells based on the received cell parameters, and may perform CLI measurements based thereon. In some cases, the UE may adjust a CLI measurement window, or may prioritize some aggressor UEs, based on the determined relationship. The UE may also transmit a CLI measurement report to the base station.


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