The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Apr. 06, 2021
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Iyab Issam Sakhnini, San Diego, CA (US);
Tao Luo, San Diego, CA (US);
Qiang Wu, San Diego, CA (US);
Wooseok Nam, San Diego, CA (US);
Yan Zhou, San Diego, CA (US);
Juan Montojo, San Diego, CA (US);
Wanshi Chen, San Diego, CA (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 7/06 (2006.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01); H04W 56/00 (2009.01); H04W 72/21 (2023.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 7/0626 (2013.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01); H04W 56/001 (2013.01); H04W 72/21 (2023.01);
Abstract
Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment may generate a Layer 1 measurement report identifying one or more measurements by corresponding measurement indices, refrain from including a measurement value in the Layer 1 measurement report for at least one measurement, and transmit the Layer 1 measurement report. Numerous other aspects are provided.