The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Mar. 08, 2023
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Morihiko Ota, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Primary Examiner:
Int. Cl.
CPC ...
H04J 14/02 (2006.01); H04Q 11/00 (2006.01);
U.S. Cl.
CPC ...
H04J 14/0212 (2013.01); H04Q 11/0005 (2013.01);
Abstract

A first WSS performs demultiplexes a first wavelength-multiplexed optical signal, outputs part of the wavelengths to a first path, and outputs a remaining wavelength to a second path. A first spectrum analyzer observes a spectrum of a first optical signal included in the first wavelength-multiplexed optical signal and a spectrum of a second optical signal output from the first WSS and outputs a first observational result. A second WSS outputs a second wavelength-multiplexed optical signal obtained by multiplexing an optical signal input from a third path to an optical signal of the remaining wavelength input from the second path. A second spectrum analyzer observes a spectrum of a third optical signal included in the optical signal input to the second WSS from the second path and a spectrum of a fourth optical signal output from the second WSS, and outputs a second observational result.


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Ota, Morihiko. (2025). Node equipment, wavelength monitor, and wavelength monitoring method (U.S. Patent No. 12388555). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12388555

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