The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Feb. 14, 2023
Applicant:

Analog Devices International Unlimited Company, Limerick, IE;

Inventor:

Islam A. Eshrah, Giza, EG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); G01R 27/28 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01); G01R 27/28 (2013.01); G01R 31/2822 (2013.01);
Abstract

Apparatus and methods for electronic testing using beamforming integrated circuits (ICs) as impedance tuners are disclosed herein. In certain embodiments, an electronic testing setup for a device-under-test (DUT) includes a radio frequency (RF) coupler including a through line connected to an output of the DUT, a first coupled line coupled to the through line, and a second coupled line coupled to the through line. Additionally, the electronic testing setup includes a beamforming IC including a first transmit channel having an output connected to the first coupled line, and a second transmit channel having an output connected to the second coupled line. A gain and a phase of the first transmit channel and a gain and a phase of the second transmit channel are each controllable to provide impedance tuning at the output of the DUT.


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