The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Jan. 26, 2021
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Tomokazu Oda, Musashino, JP;

Daisuke Iida, Musashino, JP;

Atsushi Nakamura, Musashino, JP;

Yusuke Koshikiya, Musashino, JP;

Nazuki Honda, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/2537 (2013.01); G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
H04B 10/2537 (2013.01); G01D 5/35364 (2013.01);
Abstract

An object of the present invention is to provide a Brillouin gain spectrum distribution measuring method and apparatus capable of measuring a BGS, having a line width narrower than usual, in a distributed manner in the longitudinal direction of an optical fiber under test. This measuring apparatus prepares pump light in which a pulse is added to continuous light and probe light of continuous light in which a frequency is shifted from the pump light, makes the probe light incident on one end of the FUT and the pump light incident on the other end, and obtains a time waveform of a component amplified by the pump light pulse of a probe light intensity amplified by the pump light. This measuring apparatus changes an optical frequency difference between the pump light and the probe light, and obtains a time waveform for each optical frequency difference. This measuring apparatus obtains a BGS distribution of the FUT from these time waveforms.


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