The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Mar. 01, 2022
Applicants:
University of Tsukuba, Ibaraki, JP;
Topcon Corporation, Tokyo, JP;
Inventors:
Yoshiaki Yasuno, Tsukuba, JP;
Shuichi Makita, Tsukuba, JP;
Tatsuo Yamaguchi, Warabi, JP;
Shinnosuke Azuma, Tokyo, JP;
Assignees:
UNIVERSITY OF TSUKUBA, Tsukuba, JP;
TOPCON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 30/40 (2018.01); A61B 3/113 (2006.01); G06N 20/00 (2019.01); G06T 7/20 (2017.01); G06T 7/215 (2017.01); G06T 11/00 (2006.01); G16H 30/20 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G16H 30/40 (2018.01); A61B 3/113 (2013.01); G06N 20/00 (2019.01); G16H 30/20 (2018.01); G06T 7/20 (2013.01); G06T 7/215 (2017.01); G06T 11/003 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30041 (2013.01); G16H 50/20 (2018.01);
Abstract
A method of processing ophthalmic data of some embodiment examples includes preparing a data set acquired by applying optical scanning of a two-dimensional pattern to a subject's eye. The two-dimensional pattern of the optical scanning includes a series of cycles that intersects each other. The method further includes generating position history data based on the data set. The position history data represents a temporal change in a position of the subject's eye.