The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Dec. 30, 2021
Applicant:

Inspur Suzhou Intelligent Technology Co., Ltd., Jiangsu, CN;

Inventors:

Bing Zhao, Jiangsu, CN;

Feng Li, Jiangsu, CN;

Qing Zhang, Jiangsu, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/774 (2022.01); G06V 10/30 (2022.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G06V 10/774 (2022.01); G06V 10/30 (2022.01); G06V 10/993 (2022.01);
Abstract

Disclosed is a method for training an abnormal-detection model based on an improved denoising autoencoder, including: acquiring an original image; generating a rectangular frame according to a preset range of a resolution ratio, by the improved denoising autoencoder, and occluding the original image by the rectangular frame, wherein the resolution ratio is a ratio of a resolution of an occlusion area formed by the rectangular frame to a resolution of the original image; filling random noise in the rectangular frame to obtain a noised image, by the improved denoising autoencoder; and performing constraint learning on the original image and the noised image, by the abnormal-detection model, to implement training of the abnormal-detection model. Because a learning task is more complex, it is helpful to alleviate identity mapping, and detection performance of the model is improved. The present application further provides an apparatus, a device, and a readable storage medium thereof.


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