The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Apr. 10, 2025
Applicant:

Ecopia Tech Corporation, Toronto, CA;

Inventors:

Yuanming Shu, Toronto, CA;

Shuo Tan, Campbell, CA (US);

Tuan Zhao, Toronto, CA;

Huansheng Mo, Guilin, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/44 (2022.01); G06T 7/11 (2017.01); G06T 7/50 (2017.01); G06T 7/62 (2017.01); G06V 20/10 (2022.01); G06V 20/13 (2022.01); G06V 20/17 (2022.01);
U.S. Cl.
CPC ...
G06V 10/44 (2022.01); G06T 7/11 (2017.01); G06T 7/50 (2017.01); G06T 7/62 (2017.01); G06V 20/10 (2022.01); G06V 20/13 (2022.01); G06V 20/17 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/30181 (2013.01); G06T 2207/30188 (2013.01); G06V 20/176 (2022.01); G06V 20/182 (2022.01); G06V 20/188 (2022.01);
Abstract

Methods and systems for extracting and reviewing landcover feature data are provided. An example method involves accessing geospatial imagery covering a geographic area and landcover feature data extracted from the geospatial imagery, subdividing the geospatial imagery into a grid of image tiles, assigning landcover feature data review technicians to review the image tiles and associated landcover feature data through a landcover feature data review platform, and receiving revised landcover feature data that modifies the landcover feature data.


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