The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Jan. 11, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Nguyen Thang Long Le, Richardson, TX (US);

John William Glotzbach, Allen, TX (US);

Hamid Rahim Sheikh, Allen, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 5/50 (2006.01); G06T 7/90 (2017.01); H04N 9/77 (2006.01); H04N 23/76 (2023.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 5/50 (2013.01); G06T 7/90 (2017.01); H04N 9/77 (2013.01); H04N 23/76 (2023.01); G06T 2207/10024 (2013.01); G06T 2207/10144 (2013.01);
Abstract

A method includes obtaining a reference image frame and a non-reference image frame and generating a mask based on the reference image frame and the non-reference image frame. The method also includes determining a scaling coefficient and an offset coefficient for each of multiple color channels of the non-reference image frame based on pixels in the reference image frame and pixels in the non-reference image frame that are identified by the mask. The method further includes applying the scaling and offset coefficients to the non-reference image frame in order to generate a calibration-corrected non-reference image frame.


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