The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Apr. 17, 2024
Applicant:

Htc Corporation, Taoyuan, TW;

Inventors:

Chao Shuan Huang, Taoyuan, TW;

Hao-Yun Chao, Taoyuan, TW;

Assignee:

HTC Corporation, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/02 (2018.01); G01C 22/00 (2006.01); G06T 7/536 (2017.01); G06T 7/579 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06T 7/536 (2017.01); G06T 7/579 (2017.01);
Abstract

The embodiments of the disclosure provide a tracking accuracy evaluating system, a tracking accuracy evaluating device, and a tracking accuracy evaluating method. The method includes: detecting multiple distances between the tracking accuracy evaluating device and multiple reference positions in a rotating process associated with a rotating axis, wherein an accommodating space of the tracking accuracy evaluating device accommodates a tracking device during the rotating process, and the distance sensor, the rotating axis, and the tracking device accommodated in the accommodating space have a fixed relative position therebetween; estimating a first pose variation of the tracking device during the rotating process based on the distances and the fixed relative position; obtaining a second pose variation of the tracking device during the rotating process; and determining a tracking accuracy of the tracking device based on the first pose variation and the second pose variation.


Find Patent Forward Citations

Loading…