The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Apr. 22, 2022
GE Precision Healthcare Llc, Wauwatosa, WI (US);
Yanran Xu, Beijing, CN;
Bingjie Zhao, Beijing, CN;
Hsieh Jiang, Waukesha, WI (US);
Ziyu Liu, Beijing, CN;
GE Precision Healthcare LLC, Wauwatosa, WI (US);
Abstract
An apparatus and method for configuring scan parameters for an imaging system are described. The method for configuring scan parameters includes acquiring an RGB image and a depth image of a scan object, computing physical parameters of the scan object according to the RGB image and the depth image of the scan object, and configuring, according to the physical parameters, scan parameters for scanning the scan object. In this way, the scan parameters for scanning the scan object can be automatically configured, which improves the efficiency and standardization of a scan process. Moreover, an appropriate configuration of scan parameters can further avoid rescanning and poor-quality scout images resulting from manual errors. An example apparatus that may be used to perform the method includes an acquisition unit for acquiring the RGB image, a first computation unit for computing the physical parameters, and a configuration unit for configuring the scan parameters.