The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Jun. 30, 2022
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Chaitanya Mitash, Andover, MA (US);

Manikantan Nambi, Malden, MA (US);

Shiyang Lu, Edison, NJ (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B25J 9/16 (2006.01); B25J 13/08 (2006.01); G06T 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); B25J 9/1697 (2013.01); B25J 13/08 (2013.01); G06T 1/0014 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

First image data is received via a first imaging device that represents an item being manipulated by a robotic arm, and second image data is received via a second imaging device that represents item being manipulated by the robotic arm. Using a machine-learning model to analyze the first image data, a first score is determined that represents whether the item includes a defect. Additionally, using the machine-learning model to analyze the second image data, a second score is determined that represents whether the item includes the defect. Whether the item includes the defect is based on at least one of the first score or the second score, and in such instances, the robotic arm to perform an action.


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