The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Mar. 22, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

William Ogallo, Nairobi, KE;

Girmaw Abebe Tadesse, Nairobi, KE;

Julian Bertram Kuehnert, Nairobi, KE;

Skyler Speakman, Nairobi, KE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/0242 (2023.01);
U.S. Cl.
CPC ...
G06Q 30/0243 (2013.01);
Abstract

Described are techniques for A/B testing including a computer-implemented method of identifying, in an A/B testing database, a set of feature values with a statistically significant difference in A/B testing outcomes above a threshold. The method further includes partitioning records in the A/B testing database into a plurality of population strata according to the set of feature values. The method further includes performing A/B testing, and identifying heterogeneous outcomes of the A/B testing for respective strata of the plurality of population strata.


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