The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2025
Filed:
Aug. 29, 2022
Guangdong University of Petrochemical Technology, Maoming, CN;
Shaolin Hu, Maoming, CN;
Jinpeng Chen, Maoming, CN;
Ye Ke, Maoming, CN;
Naiquan Su, Maoming, CN;
Shihua Wang, Maoming, CN;
GUANGDONG UNIVERSITY OF PETROCHEMICAL TECHNOLOGY, Maoming, CN;
Abstract
The present disclosure relates to a passive outlier-tolerant and active outlier-tolerant learning method with abnormal samples and a system thereof. The method includes the following steps: (1) judging the distribution of abnormal samples in a train set, and calling a corresponding outlier-tolerant algorithm based on the distribution to carry out feature learning on the sample feature quantity in the train set to obtain an outlier-tolerant learning result; (2) training an initial learning model by using the outlier-tolerant learning result to obtain an intermediate learning model; (3) processing the test set by a preset outlier-correction algorithm to obtain an outlier-corrected test set; (4) testing the intermediate learning model using the outlier-corrected test set to obtain a final learning model. The scheme of the present disclosure can improve the passive outlier tolerance and active outlier tolerance of a machine learning process to abnormal samples.