The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 12, 2025

Filed:

Aug. 30, 2021
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Lingdong Weng, Beijing, CN;

Bing Liu, Tianjin, CN;

Tao Chen, Beijing, CN;

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 11/008 (2013.01); G06F 11/0727 (2013.01);
Abstract

Embodiments of the present disclosure relate to a model training method, a failure determining method, an electronic device, and a computer program product. The model training method includes: acquiring a plurality of disk failure data sets collected in a first time period; acquiring another disk failure data set that is collected at a predetermined time point after the first time period and indicates failure information of at least one failed sector set; and training a failure determining model based on the plurality of disk failure data sets and the failure information, so that a probability of matching of predicted failure information at a predetermined time point determined by the trained failure determining model based on the plurality of disk failure data sets and the failure information is greater than a first threshold probability. By using the technical solution of the present disclosure, it is possible to predict the failure information that will occur in the sector set included in a disk based on the disk failure data set associated with a failed sector, so that a user or administrator of the disk can know the failure condition that will occur in the sector set of the disk in advance.


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